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74FCT162501ATPACT

74FCT162501ATPACT

Manufacturer No:

74FCT162501ATPACT

Description:

REGISTERED BUS TRANSCEIVER

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Datasheet

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74FCT162501ATPACT Specifications

  • Type
    Parameter
  • Supplier Device Package
    56-TSSOP
  • Package / Case
    56-TFSOP (0.240", 6.10mm Width)
  • Mounting Type
    Surface Mount
  • Operating Temperature
    -40°C ~ 85°C
  • Voltage - Supply
    4.5V ~ 5.5V
  • Current - Output High, Low
    24mA, 24mA
  • Number of Circuits
    18-Bit
  • Logic Type
    Universal Bus Transceiver
  • Packaging
    Bulk
  • Product Status
    Obsolete
  • Series
    74FCT
The SCANH16602SM/NOPB is an integrated circuit (IC) chip primarily designed for scan path management and control in digital systems. It offers several advantages and can be applied in various scenarios:Advantages: 1. Efficient scan path management: This IC chip provides comprehensive scan path management functionalities, enabling efficient testing and debugging of digital systems. It allows for easy reconfiguration and control of scan paths for different testing scenarios.2. Higher test coverage: By integrating the SCANH16602SM/NOPB chip into a digital system, it becomes possible to achieve higher test coverage during manufacturing testing. The chip facilitates the application of advanced test patterns to identify and diagnose faults.3. Simplified design and development: Implementing scan path management and control capabilities through this IC chip simplifies the overall design and development of digital systems. It offers a ready-to-use solution for scan path management, reducing the need for complex custom implementations.Application scenarios: 1. Semiconductor testing: The SCANH16602SM/NOPB chip is extensively used in semiconductor manufacturing for testing integrated circuits (ICs). It helps apply scan-based test methodologies that are essential for validating IC functionality, identifying manufacturing defects, and ensuring reliable end products.2. Boundary scan testing: The IC chip is commonly employed in boundary scan testing, which is a technique for testing and verifying the interconnects of digital ICs without using physical test probes. It enables comprehensive testing of IC pins and offers a convenient way to access the internal nodes of complex ICs.3. Built-in self-test (BIST): The SCANH16602SM/NOPB chip can be utilized in systems implementing BIST techniques. BIST allows for hardware-based self-testing of digital systems without external equipment. The chip plays a crucial role in configuring and controlling the scan chains used in BIST scenarios.4. System-on-Chip (SoC) verification: Integrated circuits incorporating multiple components, such as processors, memory, and peripherals, can benefit from the SCANH16602SM/NOPB chip for efficient verification and testing. It helps ensure the integrity and functionality of complex digital systems during the design and development phases.In summary, the SCANH16602SM/NOPB IC chip offers efficient scan path management and control capabilities, enabling higher test coverage and simplified design. Its applications range from semiconductor testing to boundary scan testing, BIST implementations, and SoC verification.
74FCT162501ATPACT Relevant information