Home / Translators, Level Shifters / SN74GTLP817DGVRG4/
SN74GTLP817DGVRG4

SN74GTLP817DGVRG4

Manufacturer No:

SN74GTLP817DGVRG4

Manufacturer:

Texas Instruments

Description:

IC TRANSLATOR BIDIR 24TVSOP

Datasheet:

Datasheet

Delivery:

Payment:

Please send RFQ , we will respond immediately.

SN74GTLP817DGVRG4 Specifications

  • Type
    Parameter
  • Supplier Device Package
    24-TVSOP
  • Package / Case
    24-TFSOP (0.173", 4.40mm Width)
  • Mounting Type
    Surface Mount
  • Features
    -
  • Operating Temperature
    -40°C ~ 85°C (TA)
  • Data Rate
    -
  • Output Type
    Tri-State, Inverted
  • Output Signal
    LVTTL
  • Input Signal
    GTLP
  • Channels per Circuit
    2, 6
  • Number of Circuits
    2
  • Channel Type
    Bidirectional
  • Translator Type
    Mixed Signal
  • Packaging
    Tape & Reel (TR)
  • Product Status
    Obsolete
  • Series
    74GTLP
The SCAN16512SM is a specific integrated circuit (IC) chip designed for scan-based testing of digital circuits. It offers several advantages and finds application in various scenarios. Here are some of the advantages and application scenarios of the SCAN16512SM IC chip:Advantages: 1. Scan-Based Testing: The SCAN16512SM chip is specifically designed for scan-based testing, which allows for efficient and comprehensive testing of digital circuits. It enables the observation and control of internal signals within the circuit, facilitating fault detection and diagnosis.2. High-Speed Testing: The chip supports high-speed testing, allowing for faster test execution and reduced testing time. This is particularly beneficial for complex digital circuits with large numbers of test vectors.3. Built-in Test Features: The SCAN16512SM chip incorporates various built-in test features, such as scan chains, test pattern generators, and response analyzers. These features simplify the testing process and enhance test coverage.4. Low Power Consumption: The chip is designed to minimize power consumption during testing, ensuring efficient energy usage and reducing the overall testing cost.Application Scenarios: 1. Semiconductor Manufacturing: The SCAN16512SM chip is widely used in semiconductor manufacturing for testing digital circuits during the production process. It helps identify manufacturing defects, ensure circuit functionality, and improve product quality.2. Integrated Circuit Design: During the design phase of integrated circuits, the SCAN16512SM chip is employed to verify the correctness and functionality of the circuit. It aids in identifying design flaws, optimizing circuit performance, and validating the design against specifications.3. System-Level Testing: The chip can be utilized for system-level testing of complex digital systems, such as microprocessors, ASICs (Application-Specific Integrated Circuits), and SoCs (System-on-Chips). It enables comprehensive testing of the entire system, including internal components and interconnections.4. Debugging and Fault Diagnosis: In scenarios where digital circuits exhibit unexpected behavior or faults, the SCAN16512SM chip can be used for debugging and fault diagnosis. It allows engineers to observe internal signals, analyze circuit responses, and pinpoint the root cause of the issue.Overall, the SCAN16512SM integrated circuit chip offers advantages in scan-based testing, high-speed testing, built-in test features, and low power consumption. Its application scenarios span semiconductor manufacturing, integrated circuit design, system-level testing, and debugging/fault diagnosis.
SN74GTLP817DGVRG4 Relevant information