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SY10H606JZ

SY10H606JZ

Manufacturer No:

SY10H606JZ

Manufacturer:

Microchip Technology

Description:

IC TRANSLATOR UNIDIR 28PLCC

Datasheet:

Datasheet

Delivery:

Payment:

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SY10H606JZ Specifications

  • Type
    Parameter
  • Supplier Device Package
    28-PLCC (11.48x11.48)
  • Package / Case
    28-LCC (J-Lead)
  • Mounting Type
    Surface Mount
  • Features
    -
  • Operating Temperature
    0°C ~ 85°C (TA)
  • Data Rate
    -
  • Output Type
    Differential
  • Output Signal
    PECL
  • Input Signal
    TTL
  • Channels per Circuit
    6
  • Number of Circuits
    1
  • Channel Type
    Unidirectional
  • Translator Type
    Mixed Signal
  • Packaging
    Tube
  • Product Status
    Obsolete
  • Series
    10H
The SCAN16512ASM is a specific integrated circuit (IC) chip designed for scan-based testing of digital circuits. It offers several advantages and finds application in various scenarios. Here are some of the advantages and application scenarios of the SCAN16512ASM IC chip:Advantages: 1. Scan-Based Testing: The SCAN16512ASM chip is specifically designed for scan-based testing, which allows for efficient and comprehensive testing of digital circuits. It enables the observation and control of internal signals within the circuit, facilitating fault detection and diagnosis.2. High-Speed Testing: This IC chip supports high-speed testing, allowing for faster test execution and reduced testing time. It is designed to handle high-speed digital circuits, ensuring accurate and reliable testing results.3. Built-in Test Features: The SCAN16512ASM chip incorporates various built-in test features, such as scan chains, test pattern generators, and response analyzers. These features enhance the testing capabilities and enable thorough testing of complex digital circuits.4. Scalability: The chip offers scalability, allowing for the testing of circuits with varying sizes and complexities. It can handle a large number of scan chains and supports multiple test modes, making it suitable for testing a wide range of digital designs.Application Scenarios: 1. Semiconductor Manufacturing: The SCAN16512ASM chip is commonly used in semiconductor manufacturing for testing digital circuits during the production process. It helps ensure the quality and reliability of integrated circuits before they are shipped to customers.2. Printed Circuit Board (PCB) Testing: PCBs often contain complex digital circuits, and the SCAN16512ASM chip can be used to test these circuits during PCB assembly. It enables the detection of faults and defects in the digital components, ensuring the functionality of the final product.3. System-on-Chip (SoC) Testing: SoCs integrate multiple digital circuits onto a single chip, making their testing challenging. The SCAN16512ASM chip can be employed to test the internal digital circuits of SoCs, enabling comprehensive testing and fault diagnosis.4. Design Verification: During the design phase of digital circuits, the SCAN16512ASM chip can be utilized for design verification and validation. It helps identify design flaws, timing issues, and functional errors, ensuring the correctness of the circuit design.Overall, the SCAN16512ASM IC chip offers advanced scan-based testing capabilities, making it suitable for various testing scenarios in semiconductor manufacturing, PCB assembly, SoC testing, and design verification.
SY10H606JZ Relevant information