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SN74BCT8374ANTG4

SN74BCT8374ANTG4

Manufacturer No:

SN74BCT8374ANTG4

Manufacturer:

Texas Instruments

Description:

IC SCAN TEST DEVICE W/FF 24-DIP

Datasheet:

Datasheet

Delivery:

Payment:

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SN74BCT8374ANTG4 Specifications

  • Type
    Parameter
  • Supplier Device Package
    24-PDIP
  • Package / Case
    24-DIP (0.300", 7.62mm)
  • Mounting Type
    Through Hole
  • Operating Temperature
    0°C ~ 70°C
  • Number of Bits
    8
  • Supply Voltage
    4.5V ~ 5.5V
  • Logic Type
    Scan Test Device with D-Type Edge-Triggered Flip-Flops
  • Packaging
    Tube
  • Product Status
    Obsolete
  • Series
    74BCT
The NLVPCA9306AMUTCG is a specific integrated circuit chip, and as an AI language model, I don't have access to real-time information about specific products released after my last training data in March 2023. Therefore, I cannot provide you with the specific advantages and application scenarios of the NLVPCA9306AMUTCG chip.However, in general, integrated circuit chips are used in a wide range of applications across various industries. They can be found in consumer electronics, automotive systems, telecommunications, medical devices, and many other fields. Integrated circuit chips offer advantages such as compact size, low power consumption, high reliability, and improved performance.To learn about the specific advantages and application scenarios of the NLVPCA9306AMUTCG chip, I recommend referring to the product documentation, datasheets, or contacting the manufacturer or authorized distributors of the chip. They will be able to provide you with detailed information about its features, benefits, and potential applications.
SN74BCT8374ANTG4 Relevant information