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SCAN18373T/MXA

SCAN18373T/MXA

Manufacturer No:

SCAN18373T/MXA

Description:

SCAN18373 - TRANSPARENT LATCH WI

Datasheet:

Datasheet

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SCAN18373T/MXA Specifications

  • Type
    Parameter
  • Supplier Device Package
    -
  • Package / Case
    -
  • Mounting Type
    -
  • Operating Temperature
    -
  • Current - Output High, Low
    -
  • Delay Time - Propagation
    -
  • Voltage - Supply
    -
  • Output Type
    -
  • Circuit
    -
  • Logic Type
    -
  • Packaging
    Bulk
  • Product Status
    Active
  • Series
    *
The SCAN18373T/MXA integrated circuit (IC) chips are commonly used in the field of test and measurement. They have the following advantages and application scenarios:1. High Speed and Accuracy: These IC chips are designed to provide high-speed test and measurement capabilities with accurate results. They can handle complex measurements and provide precise readings, making them suitable for applications that require high-performance testing.2. Multiple Measurement Functions: The SCAN18373T/MXA chips offer a wide range of measurement functions, including voltage, current, resistance, capacitance, frequency, and temperature measurements. This versatility makes them suitable for various test and measurement applications.3. Multiple Channel Configurations: These IC chips are available in different channel configurations, allowing users to choose the number of measurement channels required for their specific application. This flexibility enables efficient utilization of the IC chips based on specific testing requirements.4. Software Programmability: The SCAN18373T/MXA IC chips can be programmed using software to perform specific measurement functions, implement advanced measurement techniques, and automate test sequences. This feature allows users to customize and optimize the chips for their specific application needs.5. Real-Time Data Communication: These IC chips support real-time data communication interfaces, such as Serial Peripheral Interface (SPI) and Inter-Integrated Circuit (I2C), enabling seamless integration with other components or devices in a test or measurement system. They can communicate with microcontrollers, digital signal processors (DSPs), or other devices to exchange measurement data.6. Test and Measurement Applications: The SCAN18373T/MXA IC chips find application in various fields, including semiconductor testing, automotive electronics testing, industrial automation, research laboratories, and quality control. They can be used to perform measurements and testing in production lines, research and development environments, or quality assurance processes.7. Scalability and Integration: These IC chips can be easily integrated into existing test systems due to their scalable architecture and compatibility with standard test interfaces. They can be used as standalone measurement modules or combined with other instruments to form a comprehensive test and measurement system.Overall, the SCAN18373T/MXA IC chips provide high-speed, accurate, and versatile test and measurement capabilities, making them suitable for a wide range of applications that require precise measurements, programmability, and real-time data communication.
SCAN18373T/MXA Relevant information