SCANSTA111SM

SCANSTA111SM

Manufacturer No:

SCANSTA111SM

Manufacturer:

Texas Instruments

Description:

IC INTERFACE SPECIALIZED 49BGA

Datasheet:

Datasheet

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SCANSTA111SM Specifications

  • Type
    Parameter
  • Mounting Type
    Surface Mount
  • Supplier Device Package
    49-NFBGA (7x7)
  • Package / Case
    49-LFBGA
  • Voltage - Supply
    3V ~ 3.6V
  • Interface
    IEEE 1149.1
  • Applications
    Testing Equipment
  • Packaging
    Tray
  • Packaging
    Bulk
  • Product Status
    Not For New Designs
  • Series
    -
The SCANSTA111SM is an integrated circuit chip that offers various advantages and can be applied in different scenarios. Some of the advantages and application scenarios of the SCANSTA111SM chip are:Advantages: 1. Built-in Scan Test: The chip includes a built-in scan test feature, which allows for efficient testing and debugging of digital circuits. This feature simplifies the testing process and reduces the time and effort required for testing.2. Boundary Scan: The SCANSTA111SM chip supports boundary scan, also known as JTAG (Joint Test Action Group) testing. This enables testing and debugging of complex digital circuits, including those with multiple interconnected components.3. High-Speed Testing: The chip supports high-speed testing, making it suitable for applications that require fast and accurate testing of digital circuits. This is particularly useful in industries such as telecommunications, aerospace, and automotive, where high-speed and reliable testing is crucial.4. Easy Integration: The SCANSTA111SM chip is designed for easy integration into existing circuit designs. It can be easily connected to other components and systems, making it a versatile choice for various applications.Application Scenarios: 1. PCB Testing: The SCANSTA111SM chip is commonly used in the testing and debugging of printed circuit boards (PCBs). It allows for efficient testing of the PCB's digital circuits, ensuring their proper functionality before deployment.2. System-on-Chip (SoC) Testing: The chip can be applied in the testing of complex SoCs, which integrate multiple components and functionalities into a single chip. The built-in scan test and boundary scan features help in identifying and resolving any issues during the testing phase.3. Manufacturing Testing: The SCANSTA111SM chip is often used in the manufacturing process of electronic devices. It enables the testing of digital circuits at various stages of production, ensuring the quality and reliability of the final product.4. Fault Diagnosis and Repair: In scenarios where digital circuits fail or malfunction, the SCANSTA111SM chip can be utilized for fault diagnosis and repair. Its scan test and boundary scan capabilities help in identifying the faulty components or connections, allowing for targeted repairs.Overall, the SCANSTA111SM integrated circuit chip offers advantages such as built-in scan test, boundary scan support, high-speed testing, and easy integration. These features make it suitable for various application scenarios, including PCB testing, SoC testing, manufacturing testing, and fault diagnosis.