Home / Specialized / SCANSTA111SM-NS/
SCANSTA111SM-NS

SCANSTA111SM-NS

Manufacturer No:

SCANSTA111SM-NS

Manufacturer:

National Semiconductor

Description:

MICROPROCESSOR CIRCUIT, CMOS, PB

Datasheet:

Datasheet

Delivery:

Payment:

Please send RFQ , we will respond immediately.

SCANSTA111SM-NS Specifications

  • Type
    Parameter
  • Mounting Type
    Surface Mount
  • Supplier Device Package
    49-NFBGA (7x7)
  • Package / Case
    49-LFBGA
  • Voltage - Supply
    3V ~ 3.6V
  • Interface
    IEEE 1149.1
  • Applications
    Testing Equipment
  • Packaging
    Bulk
  • Product Status
    Active
  • Series
    -
The SCANSTA111SM-NS is a specific integrated circuit (IC) chip designed by Texas Instruments. It is a scan-based test and debug controller that offers several advantages and can be applied in various scenarios. Here are some of its advantages and application scenarios:Advantages: 1. Scan-Based Testing: The SCANSTA111SM-NS chip enables scan-based testing, which is a technique used to test and debug digital circuits. It allows for efficient and comprehensive testing of complex digital designs.2. Debugging Capabilities: This IC chip provides advanced debugging capabilities, allowing engineers to identify and resolve issues in digital circuits. It helps in locating faults, analyzing failures, and improving overall circuit performance.3. Reduced Test Time: The SCANSTA111SM-NS chip helps in reducing test time by enabling parallel testing of multiple circuit elements. This leads to faster testing and quicker identification of faults, resulting in improved productivity.4. Enhanced Test Coverage: With its scan-based testing approach, this IC chip offers high test coverage, ensuring that a large portion of the circuit is tested. It helps in detecting both systematic and random faults, improving the overall quality and reliability of the circuit.Application Scenarios: 1. Semiconductor Manufacturing: The SCANSTA111SM-NS chip is commonly used in semiconductor manufacturing processes. It helps in testing and debugging digital circuits during the production phase, ensuring that the manufactured chips meet the required quality standards.2. Integrated Circuit Design: During the design phase of integrated circuits, the SCANSTA111SM-NS chip can be utilized for testing and debugging purposes. It assists engineers in verifying the functionality and performance of the designed circuits, identifying and rectifying any issues.3. Electronics Testing and Repair: In the field of electronics testing and repair, the SCANSTA111SM-NS chip can be employed to diagnose faults and troubleshoot digital circuits. It aids in identifying faulty components, analyzing circuit behavior, and facilitating repairs.4. Research and Development: The SCANSTA111SM-NS chip is also used in research and development activities related to digital circuit design and testing. It helps researchers and engineers in evaluating new design methodologies, exploring novel testing techniques, and improving overall circuit performance.Overall, the SCANSTA111SM-NS integrated circuit chip offers advanced scan-based testing and debugging capabilities, leading to improved test coverage, reduced test time, and enhanced circuit reliability. Its applications range from semiconductor manufacturing to integrated circuit design, electronics testing, repair, and research and development.
SCANSTA111SM-NS Relevant information