Home / Serializers, Deserializers / SCAN926260TUFX/
SCAN926260TUFX

SCAN926260TUFX

Manufacturer No:

SCAN926260TUFX

Manufacturer:

Texas Instruments

Description:

IC DESERIALIZER X6 1:10 196-LBGA

Datasheet:

Datasheet

Delivery:

Payment:

Please send RFQ , we will respond immediately.

SCAN926260TUFX Specifications

  • Type
    Parameter
  • Supplier Device Package
    196-NFBGA (15x15)
  • Package / Case
    196-LBGA
  • Mounting Type
    Surface Mount
  • Operating Temperature
    -40°C ~ 85°C (TA)
  • Voltage - Supply
    3V ~ 3.6V
  • Number of Outputs
    10
  • Number of Inputs
    1
  • Output Type
    LVTTL
  • Input Type
    LVDS
  • Data Rate
    660Mbps
  • Function
    Deserializer
  • Packaging
    Tape & Reel (TR)
  • Product Status
    Obsolete
  • Series
    -
The SCAN926260TUFX is an integrated circuit (IC) chip developed by ON Semiconductor. It is a member of the SCAN90000 family of scan test devices specifically designed for high-speed digital circuit testing. Here are some advantages and application scenarios of the SCAN926260TUFX IC chips:Advantages: 1. High-Speed Testing: The SCAN926260TUFX supports high-speed scan testing of digital circuits, making it suitable for use in applications that require quick and efficient testing of complex and advanced digital systems. 2. Wide Scan Path: This IC chip offers a wide scan path of up to 512 channels, which enables it to handle large and complex digital designs with multiple scan chains. 3. On-Chip Pattern Generation: It includes an on-chip pattern generator that can generate complex test patterns for efficient testing of digital circuits. 4. JTAG Interface: The IC chip supports Joint Test Action Group (JTAG) interface, which allows for easy integration with other JTAG-enabled devices, simplifying the testing process. 5. Improved Signal Integrity: It incorporates features like dynamic I/O cell placement and double data rate (DDR) capture to enhance signal integrity during testing.Application scenarios: 1. Semiconductor Testing: The SCAN926260TUFX is commonly used in semiconductor testing applications, particularly for testing digital integrated circuits (ICs) and system-on-chips (SoCs). 2. Digital System Debugging: It can be utilized for debugging and validation of digital systems, helping to identify any potential faults or issues in the circuit functionality. 3. Manufacturing Test Equipment: The IC chip is suitable for use in manufacturing test equipment, where it can test and validate high-speed digital circuits, increasing production efficiency and ensuring product quality. 4. High-Speed Communication Devices: It can be employed in the testing of high-speed communication devices, such as routers, switches, and network equipment, to ensure their proper functioning and reliability.It's important to note that the specific advantages and application scenarios of the SCAN926260TUFX IC chips may vary based on the requirements and use cases of individual designs and systems.
SCAN926260TUFX Relevant information