-
Manufacturer
- Intel
- onsemi
- LSI/CSI
- Texas Instruments
- Analog Devices Inc./Maxim Integrated
- Advanced Micro Devices
- Cypress Semiconductor Corp
- Diodes Incorporated
- Fairchild Semiconductor
- Microchip Technology
- Renesas Electronics America Inc
- STMicroelectronics
- Harris Corporation
- Intersil
- National Semiconductor
- NXP USA Inc.
- Renesas Design Germany GmbH
- Rochester Electronics, LLC
- Motorola
- Nexperia USA Inc.
- NXP Semiconductors
- NTE Electronics, Inc
- Quality Semiconductor
- SMSC
- Sanyo
-
Series
- -
- *
- 100E
- 100EL
- 100EP
- 100LVEL
- 100LVEP
- 10EL
- 10E
- 10EP
- 10H
- 100S
- 4007UB
- 4008B
- 74ABTE
- 74FB
- 74GTLP
- 74SSQEB
- 74SSTU
- 74SSTUB
- 74SSTV
- 74SSTVF
- 8206
- 9304
- ATE
- FM
- GreenPAK 3™
- SY89
-
Packaging
- Bag
- Bulk
- Cut Tape (CT)
- Digi-Reel®
- Tape & Reel (TR)
- Tray
- Tube
-
Product Status
- Active
- Discontinued at Digi-Key
- Last Time Buy
- Not For New Designs
- Obsolete
-
Operating Temperature
- -55°C ~ 125°C (TA)
- -40°C ~ 125°C (TA)
- -40°C ~ 125°C
- -40°C ~ 85°C (TA)
- -55°C ~ 125°C
- -40°C ~ 85°C
- 0°C ~ 70°C
- 0°C ~ 75°C
- 0°C ~ 85°C
- -20°C ~ 70°C
- -
-
Mounting Type
- -
- Surface Mount
- Through Hole
-
Package / Case
- 6-XFDFN
- 8-DIP (0.300", 7.62mm)
- 8-SOIC (0.154", 3.90mm Width)
- 8-TSSOP, 8-MSOP (0.118", 3.00mm Width)
- 6-TSSOP, SC-88, SOT-363
- 8-UFDFN
- 8-VFDFN Exposed Pad
- 8-VFSOP (0.091", 2.30mm Width)
- 8-TSSOP, 8-MSOP (0.118", 3.00mm Width) Exposed Pad
- 8-LSSOP, 8-MSOP (0.110", 2.80mm Width)
- 8-PowerWFDFN
- 8-VFDFN Exposed Pad, 8-MLF®
- 48-CDIP
- 68-CFlatPack
- 176-TFBGA
-
Supplier Device Package
- 8-DIP
- 8-DFN (2x2)
- 6-TSOP
- 8-DSBGA (1.9x0.9)
- 6-TSSOP
- 6-XSON (0.9x1)
- 6-XSON, SOT1202 (1x1)
- 6-XSON, SOT886 (1.45x1)
- 6-XSON, SOT891 (1x1)
- 6-XSON (1.45x1)
- 6-XSON (1x1)
- 8-FC-TDFN (1.5x2)
- 12-WLCSP (1.42x1.97)
- 14-STQFN (2x1.6)
- 20-STQFN (3x2)
- 20-TQFN (2x3)
- 28-BSSOP
- 48-CDIP SB
- 52-CLCC (19.05x19.05)
- 56-VFQFP-EP (8x8)
- 64-BGA MICROSTAR (8x8)
- 68-CLCC
- 68-CQFP (12.7x12.7)
- 96-BGA (13.5x5.5)
- 100-TQFP-EPR (14x14)
- 114-LFBGA (16x5.5)
- 160-CABGA (9x13)
- 160-NFBGA (9x13)
- 160-TFBGA (13x9)
- 176-CABGA (6x15)
- 176-NFBGA (13.5x8)
- 176-NFBGA (15x6)
- 176-NFBGA (6x15)
- 176-TFBGA (15x6)
-
Number of Bits
- 8
- 10
- 12
- 3
- 4
- 6
- 7
- 9
- 11
- 2
- 5
- 1
- 13, 26
- 24, 48
- 25
- 25, 14
- 26
- 27
- 28
- 28, 56
-
Logic Type
- -
- 1:1, 1:2 Configurable Registered Buffer with Parity
- 1:1, 1:2 Configurable Registered Buffer
- 1:2 Configurable Registered Buffer with Parity
- 1:2 Configurable Registered Buffer
- 1:2 Registered Buffer with Parity
- 4-TO-1 Multiplexed/Demultiplexed Transceivers
- 8-Bit to 9-Bit Parity Bus Transceiver
- ABT Scan Test Device With Transceivers and Registers
- ABT Scan Test Device With Universal Bus Transceivers
- AND/OR Select
- Adder/Subtractor
- Addressable Scan Ports
- Arithmetic Logic Unit
- BCD Rate Multiplier
- BCD to Decimal Decoder/Driver
- Binary Full Adder with Fast Carry
- Binary Full Adder
- Binary Rate Multiplier
- Buffer/Driver with Parity
- Bus Arbiter
- Bus Termination Array
- CML Driver with Selectable Equalizer Receiver
- CML/LVPECL Backplane Transceiver w/ Integrated Loopback
- Cherry Trail Essentials
- Comparator, Driver
- Complementary Pair Plus Inverter
- Configurable Buffer with Address-Parity Test
- Configurable Registered Buffer for DDR2
- Configurable Registered Buffer
- Contact Bounce Eliminator
- Counter/Shift Register
- Crystal Oscillator Driver
- Curie Based Wearable
- Delay Element
- Differential Receiver
- Differential Receiver/Driver
- Digital Phase-Locked-Loop Filters
- Driver/Receiver
- Embedded Test-Bus Controllers
- Equalizer Receiver
- Error Detection and Correction
- Full Adder
- Full Subtractor
- IEEE STD 1284 Translation Transceiver
- Incident-Wave Switching Bus Transceivers
- Inverter, X-Tal Driver
- LVTTL-TO-GTLP Adjustable-Edge-Rate Registered Transceiver
- LVTTL/BTL Universal Storage Transceiver with Buffered Clock Line
- Line Receiver
- Linking Addressable Scan Ports
- Load Switch
- Logic Adder
- Logic Gate Array
- Look-ahead Carry Generator
- Memory Decoder
- Multiple Bus Exchange
- Multiplexer for Microprocessor
- NBCD Adder
- Power Good Detector
- Power Good Generator
- Power OK Generator
- Programmable Terminator
- Receiver, Driver, Buffer, Translator
- Registered Buffer for DDR2
- Registered Buffer with SSTL_2 Compatible I/O for DDR
- Relay Driver
- SCAN-PATH LINKERS
- Scan Test Device With Transceivers And Registers
- Scan Test Device with Buffers
- Scan Test Device with Bus Transceiver and Registers
- Scan Test Device with Bus Transceivers
- Scan Test Device with D-Type Edge-Triggered Flip-Flops
- Scan Test Device with D-Type Latches
- Scan Test Device with Inverting Buffers
- Scan Test Device with Inverting Bus Transceivers
- Scannable Register
- Schottky Barrier Diode Bus-Termination Array
- TTL/BTL Registered Transceiver
- TTL/BTL Transceiver/Translator
- TTL/BTL Universal Storage Transceiver with Buffered Clock Line
- TTL/BTL Universal Storage Transceiver
- Test Bus Controller
- Translating Transceiver
- VR Enable and Discharge
- Voltage Clamp
- Wallace Tree Adder
-
Supply Voltage
- -4.5V ~ -5.25V, 9.5V ~ 10.5V
- -4.5V ~ -6.5V, 9.5V ~ 10.5V
- -4.2V ~ -5.7V
- -2.2V ~ 5.2V
- -2.2V ~ 6.2V
- -1.5V ~ 6.5V
- -1V ~ 5.2V
- 0.8V ~ 3.6V
- 0.95V ~ 3.6V, 1.65V ~ 5.5V
- 1.25V, 1.35V, 1.5V
- 1.425V ~ 1.575V
- 1.5V ~ 5.5V
- 1.65V ~ 5.5V
- 1.7V ~ 1.9V
- 1.7V ~ 2V
- 1.71V ~ 2.625V
- 1.71V ~ 5.5V
- 2V ~ 6V
- 2.3V ~ 2.7V
- 2.3V ~ 3.6V
- 2.375V ~ 2.625V
- 2.375V ~ 2.625V, 3V ~ 3.6V
- 2.375V ~ 3.465V
- 2.375V ~ 3.6V
- 2.375V ~ 3.8V
- 2.5V ~ 5.5V
- 2.7V ~ 3.6V
- 3V ~ 15V
- 3V ~ 18V
- 3V ~ 20V
- 3V ~ 3.6V
- 3V ~ 3.6V, 4.5V ~ 5.5V
- 3V ~ 3.8V
- 3V ~ 4.5V
- 3V ~ 5.5V
- 3.135V ~ 3.465V
- 3.15V ~ 3.45V
- 3.3V, 5V
- 4.2V ~ 5.5V
- 4.2V ~ 5.7V
- 4.5V ~ 5.5V
- 4.7V ~ 5.25V
- 4.75V ~ 5.25V
- 4.75V ~ 5.5V
- 5V ~ 15V
- 5.2V
- 5.5V
- 9V ~ 18V
- -
Attribute column
Categories
|
Product |
Quantity |
Series |
Packaging |
Product Status |
Operating Temperature |
Mounting Type |
Package / Case |
Supplier Device Package |
Number of Bits |
Logic Type |
Supply Voltage |
|---|---|---|---|---|---|---|---|---|---|---|---|
|
SNJ54BCT8244AFK
Texas Instruments |
|
54BCT |
Tube |
Active |
-55°C ~ 125°C |
Surface Mount |
28-CLCC |
28-LCCC (11.43x11.43) |
8 |
Scan Test Device with Buffers |
4.5V ~ 5.5V |
|
CD54HC297F3A
Texas Instruments |
|
54HC |
Tube |
Active |
-55°C ~ 125°C |
Through Hole |
16-CDIP (0.300", 7.62mm) |
16-CDIP |
4 |
Digital Phase-Locked-Loop Filters |
2V ~ 6V |
|
SNJ54F283J
Texas Instruments |
|
54F |
Tube |
Active |
-55°C ~ 125°C (TA) |
Through Hole |
16-CDIP (0.300", 7.62mm) |
16-CDIP |
4 |
Binary Full Adder with Fast Carry |
4.5V ~ 5.5V |
|
SNJ54BCT8374AJT
Texas Instruments |
|
54BCT |
Tube |
Active |
-55°C ~ 125°C |
Through Hole |
24-CDIP (0.300", 7.62mm) |
24-CDIP |
8 |
Scan Test Device with D-Type Edge-Triggered Flip-Flops |
4.5V ~ 5.5V |
|
SNJ54ABT8652JT
Texas Instruments |
|
54ABT |
Tube |
Active |
-55°C ~ 125°C |
Through Hole |
28-CDIP (0.300", 7.62mm) |
28-CDIP |
8 |
Scan Test Device with Bus Transceiver and Registers |
4.5V ~ 5.5V |
|
SNJ54S182FK
Texas Instruments |
|
54S |
Tube |
Active |
-55°C ~ 125°C |
Surface Mount |
20-CLCC |
20-LCCC (8.89x8.89) |
4 |
Look-ahead Carry Generator |
4.5V ~ 5.5V |
|
M38510/07802BEA
Texas Instruments |
|
54S |
Tube |
Active |
-55°C ~ 125°C |
Through Hole |
16-CDIP (0.300", 7.62mm) |
16-CDIP |
4 |
Look-ahead Carry Generator |
4.5V ~ 5.5V |
|
JM38510/34201B2A
Texas Instruments |
|
54F |
Tube |
Active |
-55°C ~ 125°C (TA) |
Surface Mount |
20-CLCC |
20-LCCC (8.89x8.89) |
4 |
Binary Full Adder with Fast Carry |
4.5V ~ 5.5V |
|
M38510/31202BEA
Texas Instruments |
|
54LS |
Tube |
Active |
-55°C ~ 125°C |
Through Hole |
16-CDIP (0.300", 7.62mm) |
16-CDIP |
4 |
Binary Full Adder with Fast Carry |
4.5V ~ 5.5V |
|
CD54ACT283F3A
Texas Instruments |
|
54ACT |
Tube |
Active |
-55°C ~ 125°C |
Through Hole |
16-CDIP (0.300", 7.62mm) |
16-CDIP |
4 |
Binary Full Adder with Fast Carry |
4.5V ~ 5.5V |